Pan Pacific Symposium Conference Proceedings


EMI REJECTION AND EMC PROBLEMS IN MICROELECTRONIC SENSORS FOR AUTOMOTIVE APPLICATIONS

Authors: Alessandro Gandelli
Company: Politecnico di Milano
Date Published: 2/13/2001   Conference: Pan Pacific Symposium


Abstract: Automotive electronics is gaining a primary role in the industry production and is more and more characterizing the final performance of modern cars. The massive use of microelectronics products inside vehicular technology is nevertheless showing an increased weakness on the front of Electromagnetic Compatibility and Interference rejection. The studies performed in order to limit internal and external interference and improve final performance of the automotive equipment need to be triggered by a significant theoretical base on electromagnetic characterization of microelectronics devices. This paper just opens the door for a more in depth analysis of such a problem related to EMC and EMI limitation in assembling electronics for cars.

Keywords: Automotive Microelectronics, EMC, EMI, Microelectronics Sensors and Transducers.



Members download articles for free:

Not a member yet?

What else do you get when you join SMTA? Read about all of the benefits that go along with membership.

Notice: Sharing of articles is restricted to just your immediate work group. Downloaded papers should not be stored on an external network or shared on the internet.


Back


SMTA Headquarters
6600 City West Parkway, Suite 300
Eden Prairie, MN 55344 USA

Phone +1 952.920.7682
Fax +1 952.926.1819