“LIFE-TESTING .... SAVE TIME AND MONEY, GET BETTER DATA"Author: Tom Clifford
Company: Lockheed Martin M & S
Date Published: 2/13/2001 Conference: Pan Pacific Symposium
Key words: life-tests, statistics, test cost reduction, thermal-cycling.
Members download articles for free:
Not a member yet?
What else do you get when you join SMTA? Read about all of the benefits that go along with membership.
Notice: Sharing of articles is restricted to just your immediate work group. Downloaded papers should not be stored on an external network or shared on the internet.