Pan Pacific Symposium Conference Proceedings


Author: Tom Clifford
Company: Lockheed Martin M & S
Date Published: 2/13/2001   Conference: Pan Pacific Symposium

Abstract: Life tests are a necessary evil, when qualifying new technology in demanding applications. Typically, samples are few, time is short, testing is very expensive, decisions are consequential, and you get only one chance. Statistical planning can be the key to optimum cost-benefit. Decisions on sample size, inspection frequency, test suspension, and analysis methods will determine the cost of the test as well as the quality of resulting metrics. This paper offers practical tools, correlations, and costed examples, to help you optimize your test plan, to get you the most confidence, and the most credible marketing report, for your test dollar

Key words: life-tests, statistics, test cost reduction, thermal-cycling.

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