SMTA International Conference Proceedings


How X-Ray and AI Are Changing the Electronics Assembly Process

Authors: Bill Cardoso, Ph.D., Griffin Lemaster, Carlos Valenzuela
Company: Creative Electron, Inc.
Date Published: 9/22/2019   Conference: SMTA International


Abstract: Gartner's Technology Hype Cycle [1] puts many application of artificial intelligence (AI) and Machine Learning (ML) in around the 'peak of inflated expectations' or headed into the 'trough of disillusionment.' Meanwhile, very few have made it onto the 'slope of enlightenment' let alone the 'plateau of productivity.'

We've been working with AI for a while now and have seen real application and success in our own field. We believe that AI, when combined with other technologies, can be more than a game changer and can result in superpowers.

In this paper we will discuss how artificial intelligence (AI) is changing the way we think about x-ray inspection. Things we would never dream of doing just a few years ago are now reality by combining AI and x-ray inspection. Moreover, we will show you a series of real-life cases on how our team of AI scientists is using AI to solve the most challenging applications in x-ray inspection. And beyond x-ray inspection, we'll examine how AI is forever changing the way in which we manufacture and inspect anything.

Key Words: 

X-ray, Radiography, NDT, Counterfeit Detection, Reverse Engineering, DFM, DFXI, Artificial Intelligence



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