SMTA International Conference Proceedings


Effect of No-Clean Flux Residue on Signal Integrity at High Frequency

Authors: Jennifer Nguyen, David Geiger and Dongkai Shangguan, Ph.D.
Company: Flex Ltd.
Date Published: 9/22/2019   Conference: SMTA International


Abstract: The majority of the electronics products today are built using no-clean processes. However, the effect of no-clean flux residue on signal integrity is a concern for many Rf and high frequency products such as 5G and other communication products. No-clean flux residue can create an alternative path to the signal and degrade the signal integrity performance, especially at high frequency. There is very limited study on the effect of no-clean residue on signal integrity at such high frequency.

The purpose of this paper is to study the effects of no-clean flux residue on signal integrity at high frequency, including the high frequency spectrum used for 5G technology. The insertion losses are measured at different frequencies up to 50 GHz.

Key Words: 

5G, signal integrity, high frequency, no clean residue



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