SMTA China Conference Proceedings


Early Design Review of Boundary Scan and Test Coverage Analysis for Effective and Optimized Test Strategy

Author: Sivakumar Vijayakumar
Company: Keysight Technologies
Date Published: 4/25/2017   Conference: SMTA China


Abstract: Many a time, the PCB design is reviewed for Design for Test (DFT) at Manufacturing house just before turning on the production of the design.
  • Is it too late in the Product Life Cycle?
  • If it is, how early is better?
  • What are the benefits of doing the DFT review early?
  • Can this be done quickly in an intelligent and automated way?

    Answers to these questions are the essence of this paper.

    With Manufacturing Partners being pivotal to product quality, let us examine how DFT and Test Coverage Analysis play an important role in shaping a good test strategy.



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