SMTA International Conference Proceedings


Cleanliness Process Control an Innovative Approach to a Complex Problem

Authors: Mark McMeen, Collin Langley, Jonnie Johnson, Mike Bixenman, DBA, David Lober
Company: STI Electronics, Inc., KYZEN Corporation
Date Published: 9/17/2017   Conference: SMTA International


Abstract: Surface Insulation Resistance (SIR) testing is an effective process control method for measuring the activity level of ions trapped at the pad area and under the body of leadless components. Test boards designed with resistivity sensors allow for SIR testing on targeted low standoff devices. SIR testing is effective at characterizing soldering materials, reflow conditions and cleaning parameters to develop and monitor the process control window for building electrochemical reliability into the final assembly. SIR testing has commonly been performed by electronics testing labs on industry specific test boards. The method requires a high impedance meter, matrix switching card, power supply, power supply switching, cabling, control system and environmental chamber. With the adoption of Bottom Terminated Components, there has been a void for a process control method at the assembly site for measuring electro-chemical reliability. An improved product acceptance method is needed to characterize materials, cleaning processes and product quality. The purpose of this research is conduct exploratory research using Surface Insulation Resistance that could be used for product acceptance testing at the assembly site.

Key Words: 

Surface Insulation Resistance, SIR, Dendritic Growth, Leakage Currents, ECM



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