SMTA International Conference Proceedings

Localized Ion Chromatography Method Development and Validation

Authors: David Lober, Mike Bixenman, DBA, James Peregrin, Mark McMeen, Jason Tynes, Anna Ailworth
Company: KYZEN Corp., STI Electronics, Inc., Middle Tennessee State University
Date Published: 9/17/2017   Conference: SMTA International

Abstract: Ion Chromatography (IC) is an instrument that can be used to quantify the levels of problematic ions on a board assembly. IC testing is commonly performed on a board that is placed into an extraction solvent in a heated bath. The level of ions present on the board and under components are averaged over the surface area. The problem is that the problematic ions are commonly located under the body of components. The surface area of the component is very small. The actual level of problematic ions can be averaged down. A board may pass traditional IC testing but still be at risk. Certain types of components are more problematic than others.

Component specific test boards developed for both localized IC and SIR testing allow for analyzing problematic ions and electrical resistance responses on specific bottom terminated components. For each component placement on the test board, the area where the component is placed is routed out so the specific component can undergo localized IC testing. The purpose of this research paper is to develop and validate Localized IC testing.

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