Localized Ion Chromatography Method Development and ValidationAuthors: David Lober, Mike Bixenman, DBA, James Peregrin, Mark McMeen, Jason Tynes, Anna Ailworth
Company: KYZEN Corp., STI Electronics, Inc., Middle Tennessee State University
Date Published: 9/17/2017 Conference: SMTA International
Component specific test boards developed for both localized IC and SIR testing allow for analyzing problematic ions and electrical resistance responses on specific bottom terminated components. For each component placement on the test board, the area where the component is placed is routed out so the specific component can undergo localized IC testing. The purpose of this research paper is to develop and validate Localized IC testing.
SIR, ROSE, IC.
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