X-ray Inspection Technology - An Application Driven ApproachAuthors: Glen Thomas, Ph.D., Bill Cardoso, Ph.D.
Company: Creative Electron, Inc.
Date Published: 9/17/2017 Conference: SMTA International
However, as new x-ray technologies are introduced – from new algorithms to new hardware – users are faced with a growing range of options to choose from. Users need a solid technical background to understand the various options to make an educated decision when acquiring x-ray inspection capabilities. For example, what level of resolution is necessary for a specific application? Is an open tube or sealed source the most appropriate technology to deploy? Unfortunately, x-ray companies are not always clear about the pros and cons of each option. As a result, users end up buying too much or too little capability. In either situation, the user is left without the right x-ray inspection solution.
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