SMTA International Conference Proceedings


Comparison of Active and Passive Temperature Cycling

Authors: Mathias Nowottnick, Andrej Novikov, Dirk Seehase, and Chris Kronwald
Company: University of Rostock / Institute for Electronic Appliances and Circuits
Date Published: 9/25/2016   Conference: SMTA International


Abstract: Electronic assemblies should have longer and longer service life. Today there are partially demanded 20 years of functional capability for electronics for automotive application. On the other hand, smaller components, such as resistors of size 0201, are able to endure an increasing number of thermal cycles until fail of solder joints, so these are tested sometimes up to 4000 cycles. But testing until the end of life is essential for the determination of failure rates and the prognosis of reliability. Such tests require a lot of time, but this is often not available in developing of new modules. A further acceleration by higher cycle temperatures is usually not possible, because the materials are already operated at the upper limit of the load. However, the duration can be shortened by the use of liquids for passive tests, which allow faster temperature changes and shorter dwell times because of better heat transfer compared to air. The question is whether such tests lead to comparable results and what failure mechanisms are becoming effective. The same goes for active temperature cycles, in which the components itself are heated from inside and the substrate remains comparatively cold. This paper describes the various accelerated temperature cycling tests, compares and evaluates the related degradation of solder joints.

Key Words: 

Reliability, Testing, Temperature Cycling, Power Cycles



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