Symposium Conference Proceedings


Electronic Components & Materials Compatibility

Author: Eddie Hofer
Company: Rockwell Collins
Date Published: 11/18/2014   Conference: Symposium


Abstract: PowerPoint Presentation Only

The scope of this presentation would be to highlight the work being done within IPC to help develop guidance on cleaning compatibility issues, develop test methodologies to troubleshoot issues in manufacturing and to ultimately provide a better solution than the current Mil-Std-202 Method 215 which is widely utilized today. Mil-Std-202 and 215 test methods do not accurately represent modern cleaning chemistries and the cleaning equipment advancements that are currently used within electronic assembly manufacturing processes.



Members download articles for free:

Not a member yet?

What else do you get when you join SMTA? Read about all of the benefits that go along with membership.

Notice: Sharing of articles is restricted to just your immediate work group. Downloaded papers should not be stored on an external network or shared on the internet.


Back


SMTA Headquarters
6600 City West Parkway, Suite 300
Eden Prairie, MN 55344 USA

Phone +1 952.920.7682
Fax +1 952.926.1819