SMTA China Conference Proceedings

DfX - Design for Excellence - How to Build a Consistent Design-to-Test Flow in Order to Deliver Defect-free PCBAs

Authors: Christophe Lotz, Peter Collins, and Meng Rui
Company: ASTER Technologies and iNeTest-China
Date Published: 4/21/2015   Conference: SMTA China

Abstract: This paper is in English only.

Design for Excellence (DfX) can be used as part of an organization's Continuous Improvement Programme to decrease product development time, product cost and manufacturing cycle time, while increasing product quality, reliability and ultimately the customer satisfaction.

It will significantly decrease the overall cycle time from the design concept to customer delivery, which is a critical success factor. Design for Excellence makes it possible to implement a Lean Test approach that produces a lower cost product whilst maintaining the highest quality.

ASTER's vision is articulated on two principles: 1.Using traceability and repair loop information in order to qualify the customer defect universe. The defects include design defects, manufacturing defects and functional defects. 2.Using TestWay to import the defect opportunities and identify the possible consequences of inadequate testability and test coverage on a new design.

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