SMTA International Conference Proceedings

Inspection Strategies for More Accurate, Faster and Smarter Inspection

Authors: Subodh Kulkarni, Ph.D., Sean Langbridge, Dick Johnson
Company: CyberOptics Corporation
Date Published: 9/28/2014   Conference: SMTA International

Abstract: This paper demonstrates different inspection strategies to help achieve better accuracy in solder paste measurement reduce programming time and fine-tuning with advanced modelling techniques and establish automated print optimization utilizing process trend data. These inspection strategies are aimed at improving the product quality, reducing total cost of ownership, lowering scrap and rework costs and enhancing yield – all of which are critical elements in a manufacturing process.

Key Words: 

SPI, AOI, Statistical Modelling, Print Optimization, PCA

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