THE SEARCH FOR YIELD IMPROVEMENT: QUALITY METRICS IN THE EMS INDUSTRYAuthor: Brian Coll
Company: Manufacturers’ Services Ltd.
Date Published: 8/23/1998 Conference: Surface Mount International
This paper defines the critical elements of a global Continuous Process Improvement program. It identifies the key elements of the program, including: establishing benchmarks for world-class performance metrics, standardized metrics, and the migration from data collection to control charting to process capability studies for all key operations. It will also offer guidance on developing models based on statistical measurements, such as Cp/Cpk and Defects per Million Opportunities (DPMO), that will enable manufacturers to better understand processes and subsequently drive improvement both at the design and manufacturing levels.
“You cannot fix what you cannot measure” is one piece of advice that many PCB manufacturers should not ignore.
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