SMTA International Conference Proceedings

New Directions In Electrical Test Scalability & Automation

Authors: Alan Albee and Bobby Griffis
Company: Teradyne, Inc.
Date Published: 10/13/2013   Conference: SMTA International

Abstract: This paper describes how In-Circuit Test Systems have evolved to solve the challenges of performing electrical testing in the automated manufacturing environment. Special focus will be given to a new brand of in-line automated electrical test system features that employ "Zero Footprint" design concepts and the extension of the "Multi- Site" testing model, first pioneered by the Semiconductor chip test industry, to fully assembled Printed Circuit Board test systems.

Key Words: 

In-circuit test, automation, PCB manufacturing, inline, zero footprint, multi-site testing, SMT assembly, manufacturing test

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