SMTA International Conference Proceedings

Capillary IC – A New Platform For Detection Of Ionic Compounds On Electronic Components

Author: Peter Bodsky
Company: ThermoFisher Scientific
Date Published: 10/13/2013   Conference: SMTA International

Seika Machinery, Inc.

Abstract: Printed circuit boards (PCBs) can suffer from a variety of problems if the surface is contaminated with electrically conducting materials or ions. Combined with moisture, this can lead to corrosion and pitting of the metal surfaces. Determination of the specific ion or ionic contaminants has been the focus of considerable testing and research. Ion chromatography is an established tool for this determination. With the advent of Capillary Reagent Free IC, there are a number of advantages in capturing and measuring these ions. Most notably, there is a dramatic reduction in the amount of sample required - less than 1 micro liter. This improvement has facilitated new techniques for low-volume sampling of the specific failure site. In addition, Capillary IC systems provide improved performance for determination of target analytes at trace (parts per trillion) levels. Specific examples of trace anionic and cationic contamination will be presented. In addition, new low-volume sampling techniques and protocols will be discussed.

Key Words: 

Capillary, ionic, trace, contamination, failure analysis.

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