SMTA International Conference Proceedings


Copper Wire Bond Failure Mechanisms

Authors: Randy Schueller, Ph.D.
Company: DfR Solutions
Date Published: 10/14/2012   Conference: SMTA International


Abstract: Wire bonding a die to a package has traditionally been performed using either aluminum or gold wire. Gold wire provides the ability to use a ball and stitch process. This technique provides more control over loop height and bond placement. The drawback has been the increasing cost of the gold wire. Lower cost Al wire has been used for wedge-wedge bonds but these are not as versatile for complex package assembly. The use of copper wire for ball-stitch bonding has been proposed and recently implemented in high volume to solve the cost issues with gold. As one would expect, bonding with copper is not as forgiving as with gold mainly due to oxide growth and hardness differences. This paper will examine the common failure mechanisms that one might experience when implementing this new technology.

Key Words: 

Cu Wire Bonding, Failure Mechanisms, Failure Modes, Defects, Process Control



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