The Relevance Of Long-Duration TLP Stress On System Level ESD DesignAuthors: Gianluca Boselli, Akram Salman, Jonathan Brodsky, and Hans Kunz
Company: Analog Technology Development ESD Lab, Texas Instruments Inc.
Date Published: 10/16/2011 Conference: SMTA International
Electrostatic Discharge (ESD), ESD System-Level Design, IEC 61000-4-2, ISO10605, Filamentary conduction
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