SMTA International Conference Proceedings


USING X-RAY SYSTEMS TO DETECT COUNTERFEIT AND REWORKED ELECTRONIC COMPONENTS

Author: Art Ogg
Company: World Micro
Date Published: 10/24/2010   Conference: SMTA International


Abstract: Much has been said and written about the accuracy of visual attribute inspections of potentially counterfeit components. The techniques and procedures being used to inspectcounterfeit and reworked electronic components in the open marketplace can be quite effective in most cases.

The Independent Distributors of Electronics Association(www.IDofEA.org) has produced an industry accepted inspection standard, IDEA-STD-1010. It provides a wealth of information about visually inspecting components and in most cases will allow the inspector to make preliminary decisions about the legitimacy of any given part.

This paper will provide additional knowledge about new techniques using x-ray photography acquisition methods recently developed that will speed the detection and accuracy during the process of inspecting counterfeit components.

X-ray photographs of counterfeited parts along with the explanations detailing how they were detected are explained in this document. Often overlooked clues left behind by even the most experienced counterfeiters are discussed.

Key words: Counterfeit, Component, X-ray, Inspection



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