Pan Pacific Symposium Conference Proceedings


Authors: Daryl L. Santos, Ph.D.
Company: SSIE Department, Binghamton University
Date Published: 1/26/2010   Conference: Pan Pacific Symposium

Abstract: As six sigma and better processes are demanded for higher yields and as organizations move from measuring defects in terms of parts-per-million (ppm) towards parts-per-billion (ppb), the resolution of extant control charts is becoming insufficient to monitor process quality. This work describes the development of a new statistical process control (SPC) chart that is used to monitor processes in terms of defects-per-billion-opportunities (dpbo). A logical extension of the defects-per-million-opportunities (dpmo) control chart, calculations used to derive the dpbo control limits will be presented and examples of in-control and out-of-control processes will be offered.

Key words: statistical process control, SPC, dpmo, dpbo, attributes data, ppm, ppb

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