HIGHLY ACCELERATED TESTING OF CAPACITORS FOR MEDICAL APPLICATIONS
Authors: Travis Ashburn and Dan Skamser Company: KEMET Electronics Date Published: 1/31/2008
Medical Electronics Symposium
Abstract: As the market for medical devices continues to grow and expand, it has become evident that product reliability must remain a top priority for medical device manufacturers. In order to guarantee reliability, device manufacturers must choose reliable medical grade components for their high reliability applications. Reliability for passive components, especially capacitors, is typically conducted through accelerated and highly accelerated life testing (HALT). Models are used to fit the distributions of insulation resistance to provide prediction capability for lifetime estimates. Risk is minimized by correctly rating the capability (temperature and voltage) of capacitors based on the models. In this paper, Models and Time to Failure (TTF) predictions at application conditions for the widely used X7R and C0G ceramic capacitors will be discussed.