Medical Electronics Symposium Conference Proceedings


HIGHLY ACCELERATED TESTING OF CAPACITORS FOR MEDICAL APPLICATIONS

Authors: Travis Ashburn and Dan Skamser
Company: KEMET Electronics
Date Published: 1/31/2008   Conference: Medical Electronics Symposium


Abstract: As the market for medical devices continues to grow and expand, it has become evident that product reliability must remain a top priority for medical device manufacturers. In order to guarantee reliability, device manufacturers must choose reliable medical grade components for their high reliability applications. Reliability for passive components, especially capacitors, is typically conducted through accelerated and highly accelerated life testing (HALT). Models are used to fit the distributions of insulation resistance to provide prediction capability for lifetime estimates. Risk is minimized by correctly rating the capability (temperature and voltage) of capacitors based on the models. In this paper, Models and Time to Failure (TTF) predictions at application conditions for the widely used X7R and C0G ceramic capacitors will be discussed.



Members download articles for free:

Not a member yet?

What else do you get when you join SMTA? Read about all of the benefits that go along with membership.

Notice: Sharing of articles is restricted to just your immediate work group. Downloaded papers should not be stored on an external network or shared on the internet.


Back


SMTA Headquarters
6600 City West Parkway, Suite 300
Eden Prairie, MN 55344 USA

Phone +1 952.920.7682
Fax +1 952.926.1819