Pan Pacific Symposium Conference Proceedings


NEW METHODS FOR EVALUATING THE CLEANLINESS BENEATH LOW STANDOFF DEVICES

Author: Thomas M. Forsythe
Company: Kyzen Corporation
Date Published: 1/24/2008   Conference: Pan Pacific Symposium


Abstract: The steady drum beat of miniaturization is driven by the insatiable demands of consumers for ever smaller, ever more capable, ever more reliable hand help and portable devices. These market moving trends have pushed technology development for the past few decades, and show no signs abatement. The combination of these requirements: smaller size, more capable, and more reliable are creating new demand for effective cleaning technology that heretofore was seen more commonly in military applications.

As cleaning returns to many assembly houses after a "none-too-brief" hiatus, many manufacturing engineers find themselves searching for standards and accepted metrics to enable cleaning process implementation. The purpose of this paper is to discuss the evolution and current state of the art for evaluating cleanliness of electronic devices including process design, process validation, and daily manufacturing floor quality monitoring. A detailed discussion of accepted industry standards, as well as new emerging techniques, is accelerating the evaluation and implementation timeline for hard pressed process design engineers.



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