NEW METHODS FOR EVALUATING THE CLEANLINESS BENEATH LOW STANDOFF DEVICESAuthor: Thomas M. Forsythe
Company: Kyzen Corporation
Date Published: 1/24/2008 Conference: Pan Pacific Symposium
As cleaning returns to many assembly houses after a "none-too-brief" hiatus, many manufacturing engineers find themselves searching for standards and accepted metrics to enable cleaning process implementation. The purpose of this paper is to discuss the evolution and current state of the art for evaluating cleanliness of electronic devices including process design, process validation, and daily manufacturing floor quality monitoring. A detailed discussion of accepted industry standards, as well as new emerging techniques, is accelerating the evaluation and implementation timeline for hard pressed process design engineers.
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