REAL TIME X-RAY INSPECTION SYSTEM: AN ALTERNATIVE INSPECTION SCHEME FOR FINE-PITCH ICs
Author: Rodolfo del Mundo Company: Creation Technologies Date Published: 10/11/2007
Abstract: As the use of Surface Mount (SMT) increases and with it, the use of Fine Pitch Devices (PFDs) so does the need to effectively inspect the boards. Visual inspection of the quality of solder joints as criterion to reject or accept has been adopted as most prevalent technique. With the increase density of circuitry and miniaturized size of solder joints, visual inspection, even with optical aid, becomes more humanly strenuous and in some cases very difficult. This paper will describe a real time x-ray inspection system and its implementation into manufacturing as an alternative scheme for inspecting fine pitch ICs. Topics such as problems and solutions related to fine pitch inspection will presented.