Pan Pacific Symposium Conference Proceedings


Authors: Thomas M. Forsythe and Michael Bixenman
Company: Kyzen Corporation
Date Published: 1/31/2007   Conference: Pan Pacific Symposium

Abstract: Advanced Packing design and capabilities continue to advance at a rapid rate with increase market demand for flip chip assemblies, which drives wafer level packaging. There has been significant evolution of both cleaning requirements and solutions over the past few years. As Flip Chip I/O counts continue to increase, reliability concerns have renewed design engineers interest to study the benefits of removing flux residue. The purpose of this paper reports advanced cleaning process research to open the process window when cleaning flux residues from beneath low stand off devices. The paper will focus on advanced cleaning fluid and mechanical impingement design factors that open the process window. Data will be presented from comprehensive, ongoing studies designed to evaluate the match between soldering and cleaning technologies across a broad range of process technology equipment options.

Members download articles for free:

Not a member yet?

What else do you get when you join SMTA? Read about all of the benefits that go along with membership.

Notice: Sharing of articles is restricted to just your immediate work group. Downloaded papers should not be stored on an external network or shared on the internet.


SMTA Headquarters
6600 City West Parkway, Suite 300
Eden Prairie, MN 55344 USA

Phone +1 952.920.7682
Fax +1 952.926.1819