Pan Pacific Symposium Conference Proceedings


Author: Tom Clifford
Company: Lockheed Martin Space Systems Company
Date Published: 1/17/2006   Conference: Pan Pacific Symposium

Abstract: Life testing, particularly accelerated thermal-cycle reliability, is becoming central to package development, to qualify new technology in demanding applications. Typically, samples are few, data is rare and precious, and decisions are consequential. Proper planning is the key to optimum cost-benefit in testing. In addition, credible presentation of your t-cycle data, as well as correct interpretation of suppliers' data is pivotal in sales, procurement and business decisions. This paper offers practical tools and case-histories, to show how to set up the test, how to reduce and interpret the data, and how to evaluate technical literature and suppliers' claims, without the need for expensive consultation or software.

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