SMTA International Conference Proceedings


Author: Ken Klima
Company: Rockwell Automation
Date Published: 9/25/2005   Conference: SMTA International

Abstract: Automated Optical Inspection (AOI) provides a unique opportunity for seeing detailed views of the electronic assembly process. Each time an image is taken during an inspection, the processes of the screen printers, placement machines, and reflow ovens are captured and reviewed. This new technology draws upon existing skill sets of the Process Engineers but also introduces new skill sets to the associates running the lines and the employees selected to program the machine. How these employees interact greatly affects the success of AOI.

AOI has been introduced into the manufacturing process at two of our manufacturing facilities. Both facilities are running identical AOI machines. The top priority of AOI is to use the inspection results as process feedback to aid in eliminating defects. In addition, the AOI machine is being used to measure the accuracy of the placement machines allowing them to be calibrated more closely than ever before.

This paper will provide an AOI programmer’s view of the steps taken to implement AOI into the manufacturing process. Topics covered will include tasks that need to be identified when developing a plan, making best use of the training experience, developing effective AOI programs, supporting programs in production, and using data from the AOI machine to reduce defects. This paper will help the reader understand the terminology unique to AOI and will provide tips for efficient program development using realworld examples.

In addition, algorithms will be dissected to examine how poor program parameters or a change in parts can lead to false calls. Actual machine images will be provided to assist in explaining defects, process indicators, and false calls. After reading this paper, the reader should have a good understanding of what tasks need to be performed to successfully implement, program, and support AOI.

Key words: AOI, defects, false calls, algorithm.

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