SMTA International Conference Proceedings


FIRST PASS YIELD ENHANCEMENT THROUGH STRATEGIC IMPLEMENTATION OF AOI AS A PROCESS IMPROVEMENT TOOL

Author: Fredrika M. Haneborg-Luhr
Company: Vision Inspection Technology
Date Published: 9/25/2005   Conference: SMTA International


Abstract: Refined AOI technology in terms of ultra high accuracy and repeatability in combination with powerful software developments, have created broad possibilities for process management in electronics manufacturing. This is possible through the collection of assembly and inspection equipment critical data, and the subsequent consolidation and analysis of the same.

These new methods combined with full SPC capability, will allow companies to see trends and find errors before they occur. These new capabilities are created by AOI manufacturers who are working with assembly equipment manufacturers, and with third party software providers, in order to close the loop using software which communicates from the AOI directly to the process.

Key words: AOI, Inspection, Process Management, SPC, Pick & Place, Yield Enhancement



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