GENERAL APPROACH IN REDUCING EMI FOR 3D MICROELECTRONICS SENSORSAuthors: Alessandro Gandelli et al.
Company: Politecnico di Milano
Date Published: 2/25/2005 Conference: Pan Pacific Symposium
Such design techniques devoted to reduce EMI effects allow to improve criteria for the optimal noise and interference reduction and improve cross-coupling rejection. In particular inductive and capacitive coupling between adjacent planes and components are not so efficiently reduced by current design technologies, but they find their benefits in novel developmental approach.
On the other hand the well mentioned cluster approach  allows to completely re-define the placement of functions on multi-stacked devices and, by adopting new simulation tools, to find suitable solutions for developing efficient and cost effective products. Local models of coupling for specific internal design and dedicated package are examined and compared in this paper from the general EMC point of view in order to guarantee maximum level of noise rejection.
A detailed analysis of operative frequencies and their reciprocal effects inside the circuitry are examined in the complexity of the theoretical study of these devices and open the way for improving new classes of numerical simulator devoted to the development of such devices.
Key words: 3D Microelectronics, Packaging, EMI.
Members download articles for free:
Not a member yet?
What else do you get when you join SMTA? Read about all of the benefits that go along with membership.
Notice: Sharing of articles is restricted to just your immediate work group. Downloaded papers should not be stored on an external network or shared on the internet.