INLINE FLUX VOLUME MEASUREMENT FOR CSP PROCESS CONTROLAuthor: Stacy Kalisz
Date Published: 1/25/2000 Conference: Pan Pacific Symposium
The paper reviews the techniques evaluated for flux measurement, and details the novel method chosen; the measurement of naturally occurring fluorescent emissions of the flux which occur when it is excited by ultraviolet light. These emissions have been calibrated using machine vision techniques to provide micron level measurements of location, height, and volume measurements of flux deposits, as well as identification of common shape defects.
This paper includes results on 16 fluxes commonly used in BGA/CSP manufacture including no-clean, water and solvent cleaned fluxes. Images and Scanning Electron Microscope (SEM) photos show the nature of the 3D representations. Experimental results on actual packages showing gage reproducibility and repeatability (GR&R), correlation of data to defects and use of the data for statistical process control (SPC) control are also provided.
Keywords: CSP, Flux Deposition, Inline Process Control
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