SMTA International Conference Proceedings


Author: Mark J. Norris
Company: Vision Inspection Technology
Date Published: 9/26/2004   Conference: SMTA International

Abstract: AOI has been gaining credibility over the last few years as a process tool, capable of doing a lot more than just finding defects. However many manufacturers today are still only using the AOI tools in their possession to locate and repair process defects instead of using AOI to trace the source of defects, avoid defects or close the loop with Pick & Place machines to have a Zero Defect Process. This paper will include case studies with both Siemens Pick & Place as well as Fuji equipment which show how by using the data available wisely, the AOI tool is a process tool, capable of reducing and eliminating defects.

Key words: Vision Inspection, Process Control, SPC, Defect Detection, Traceability, Zero Defect Line.

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