NEPCON West - Fiberoptic Expo Conference Proceedings


INDUSTRY-WIDE DESIGN FOR TESTABILITY GUIDELINES

Author: Louis Y. Ungar
Company: A.T.E. Solutions, Inc.
Date Published: 12/3/2002   Conference: NEPCON West - Fiberoptic Expo


Abstract: With industry-wide participation a set of practical Design for Testability (DFT) Guidelines has been compiled. Based on an earlier document created and published by the Surface Mount Technology Association (SMTA), a number of engineers from various companies collaborated to improve and update those guidelines. Under the SMTA’s Testability Committee a number of task forces were established in order to focus on various aspects of testable designs.

The guidelines provide practical directions on what actions board-designers can take to make their designs more testable. This paper reports on how these guidelines were developed, how the participants were organized and how such an effort can be a model for industry-wide consensus on dealing with testability problems. Parts of some of the guidelines are also included for illustration purposes only.



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