AUTOMATED OPTICAL INSPECTION (AOI) - A YIELD MANAGEMENT SOLUTION FOR THE HIGH DENSITY INTERCONNECTION (HDI) INDUSTRYAuthor: Thomas Cinque et al.
Company: MIDAS Vision Systems
Date Published: 12/3/2002 Conference: NEPCON West - Fiberoptic Expo
These developments are made possible through advances in HDI (High Density Interconnect) circuit technology - the key attributes of HDI being packaging adaptability, circuit density, and more functionality on less real estate. Portable electronic manufacturers have a development roadmap to reduce the size for lines and spaces of the conductor traces below 50 µm. Many flexible circuit designs already contain areas with 50 µm lines and spaces, and designs with less than 30 µm are currently underway.
The demand for increased packaging density has intensified pressure on process, production, and quality control personnel to ensure that substrates can be produced in a timely manner with acceptable yields. Electrical testing can detect opens and shorts in the package, but cannot detect the more subtle defects that might result in field failures. Visual inspection in every step of the process is virtually impossible and unreliable given the small lines and spaces that will challenge a 100% inspection of the circuit. Neither of these traditional inspection methods produces the process feedback needed to improve the manufacturing process.
Automated Optical Inspection (AOI) is a necessary production yield management tool and provides important process feedback. However, traditional AOI technology cannot accurately inspect the fine features being manufactured in the HDI arena. This paper will discuss a method for implementing AOI into HDI manufacturing and how it serves as an enabling technology by providing reliable, consistent 100% inspection. Furthermore, this paper will illustrate how proper implementation and integration of AOI can provide real-time process feedback and the resultant yield increases that accrue.
Key words: automated optical inspection, AOI, high density interconnect, HDI, process monitoring, yield management.
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