SMTA International Conference Proceedings


INTEGRATED TEST TECHNOLOGIES TO IMPROVE YIELDS AND REDUCE COST TO TEST

Author: Haydn Povey
Company: National Instruments
Date Published: 9/22/2002   Conference: SMTA International


Abstract: Today, manufacturing faces some of the toughest economic and technology pressures ever. Along with a sustained downturn, which has significantly reduced investment in new manufacturing test processes, the increasing density, complexity, and characteristics of new products stretches traditional testing methodologies beyond their capabilities.

To meet these new challenges, many organizations move away from traditional models of manufacturing and testing to more integrated solutions that provide the flexibility to meet the upcoming technical hurdles and achieve business goals. In this article, we examine this integration of technologies, based on boundary-scan and functional test hardware and software, which deliver improved quality at a dramatically lower cost.

Key words: automated test, functional test, in-circuit test, boundary scan, AOI, AXI.



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