OPTIMIZING TEST STRATEGIES DURING PCB DESIGN FOR BOARDS WITH LIMITED ICT ACCESSAuthor: Charles Robinson & Amit Verma
Company: Teradyne Inc.
Date Published: 5/15/2002 Conference: Telecom Hardware Solutions
Using DFT software during PCB design to model the fault coverage of different test strategies and make ICT access tradeoffs can significantly reduce cost and improve quality. Defect capture rates more than doubled when using alternate test strategies and production line beat rates varied significantly depending on the test strategy chosen. When DFT software enables these decisions early in the product life cycle, both OEMs and EMS providers can win by driving cost reductions through the entire product life cycle from NPI through manufacturing and warranty.
Keywords: AXI, AOI, DFT, DFM, DFx, Test Strategy, ICT, Limited Test Access.
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