Journal of SMT Article
TIN WHISKER GROWTH AND PREVENTION
Company: Lucent Technologies
Date Published: 10/1/2000 Volume: 13-4
This paper analyzes the current understanding of the whisker phenomena, and describes a systematic whisker test that could find wide applicability in the electronics industry. Correlation is found between whisker growth and coating properties such as carbon content and grain size.
Key words: whisker, whisker test, electroplated tin.
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