Assessment of 2nd Level Interconnect Quality in Flip Chip Ball Grid Array (FCBGA) Package Using Laser Ultrasonic Inspection Technique
Authors: Vishnu V. B. Reddy, I. Charles Ume, Aaron M. Mebane, Kola Akinade, Amiya R. Chaudhuri, Bryan Rogers, Cherif Guirguis, Kathy Derksen, Parimal Patel Company: Georgia Institute of Technology and MGMT-Quality, Cisco Systems, Inc. Date Published: 7/30/2019
Abstract: Flip chip packaging has become technology priority for the semiconductor industry due to its higher performance, higher I/O density, and reduced package foot print. One of the major difficulties with flip chip technology is testing its reliability. Advancements in Scanning Acoustic Microscopy (SAM) can provide insight into 1st level joint interconnects. However, these traditional solder joint inspection methods have been very unsatisfactory in assessing 2nd level interconnects because of the location and physical configuration of these solder joints. Non-destructive methods like SAM and X-Ray have their own limitations in assessment of 2nd level interconnects. The Laser Ultrasonic Inspection Technique uses laser pulses to generate bulk ultrasonic waves in the package, and the reflected waves from the 2nd level interconnect can give us information about the quality of the joint. A fiber-coupled laser interferometer is used to measure the transient out of plane displacements on the surface of the package. This is a direct measure of the reflected ultrasonic wave strength. Laser power can be adjusted depending on the size of the package to generate bulk waves of sufficient strength to reach the interconnections. In this project, Flip Chip Ball Grid Array (FCBGA) packages (foot print size 52.5mm x 52.5mm) from Cisco Systems were subjected to mechanical shock tests and analyzed using a Laser Ultrasonic Inspection (LUI) system. The LUI results are supported using cross sectioning results. The samples are also tested using X-Ray and C-SAM, and the results are compared with those of the LUI system. The LUI system test results have demonstrated that the LUI method holds a great promise for assessing the presence of defects in 2nd level interconnects.
Laser Ultrasonic Inspection, Non-Destructive Method, Pad cratering, Inter Metallic Crack, Drop Test