Probabilistic Design for Reliability (PDFR) of Medical Electronic Devices (MEDs): When Reliability Is Imperative, Ability to Quantify It Is a Must
Authors: E. Suhir and S. Yi Company: Portland State University and ERS Co. Date Published: 3/1/2017
Abstract: The recently suggested probability design for reliability (PDfR) concept can be effectively used for making a viable medical electronic device (MED) into a reliable product. Understanding the physics-of-failure is critical to the assurance of the electronics reliability, and the PDfR concept has therefore its experimental basis in the highly focused and highly cost-effective failure oriented accelerated testing (FOAT). This testing is geared to the Boltzmann-Arrhenius-Zhurkov (BAZ) equation - a physically meaningful and effective predictive model that can be used for the prediction of the remaining useful lifetime (RUL) of the electronic product of interest. It is shown also how the physics-of-failure-based BAZ model can be sandwiched between two statistical models, when there is a need to diagnose a presumably faulty device (Bayes theorem can be used to do that), assess its RUL (using BAZ model) and update the product's reliability (this can be done using beta-distribution). Such a three-step-concept (TSC) can be applied to many areas of the electronics technology, including MEDs. The emphasis of the analysis is on numerical examples (devil is in details!), while the substances of the employed BAZ, Bayes' and beta-distribution models are described in the appendices.