Symposium on Counterfeit Parts and Materials

Workshops

Thursday, June 25

Workshops will be held on Thursday, led by industry professionals with extensive experience in their respective subject areas. Workshop instructors deliver focused, in-depth presentations on topics of timely importance, based on their research and industry experience.

WS1: Training Course on Implementation of SAE AS6171 General Requirements and Associated Test Methods for Detection of Counterfeit Electronic Parts

Michael H. Azarian, Ph.D., CALCE

WS2: Utilizing IPC-1782 - Component Traceability - To Reduce Risk Associated with Ingress of Counterfeit Components

Cameron Shearon, Raytheon & Michael Ford, Aegis Software

WS3: Electronic Part Obsolescence Forecasting, Mitigation, and Management

Peter Sanborn, Maryland Technology Enterprise Institute (Mtech)




WS1: Training Course on Implementation of SAE AS6171 General Requirements and Associated Test Methods for Detection of Counterfeit Electronic Parts

Michael H. Azarian Michael H. Azarian, Ph.D., Center for Advanced Life Cycle Engineering (CALCE)/ University of Maryland
Full-Day

Overview
Counterfeit parts have found their way into every sector of industry, from consumer electronics and appliances to safety-critical areas including avionics, medical devices, and military systems. Parts shortages and obsolescence have provided opportunities for counterfeiters to capitalize on the demand for parts that may be in short supply. Counterfeits have even found their way into parts of the supply chain that would not normally be doubted. The variety and volume of counterfeit parts in circulation has been growing as counterfeiters devise increasingly sophisticated and devious methods of covering their tracks.

Prior to the availability of standards that govern test methods for counterfeit part detection and avoidance, organizations and test laboratories developed widely varying approaches to mitigating the risk. This led to inconsistencies and gaps in the processes, technologies, and quantitative risk assessment methodologies needed to address the problem.

SAE established the G-19A Test Laboratory Standards Development Committee to develop a risk-based testing standard for counterfeit detection and avoidance. Over the past six years, subject matter experts and interested parties from industry, government, academia, and test laboratories have come together to develop a set of twelve documents that set out requirements and recommendations for risk assessment, test procedures and selection, sampling criteria, training, workmanship, and reporting associated with detection of counterfeit electrical, electronic, and electromechanical parts. In October 2016 these documents were published as the AS6171 family of standards, consisting of a general requirements document and eleven slash sheets covering the test methods and the risk-based selection of test sequences for counterfeit part detection. Their impact will be difficult to underestimate, as they fill a huge void in industry's arsenal for combating a pernicious threat.

Course Description
This full-day course will provide a thorough introduction to the requirements and hierarchy of the AS6171 Test Methods Standard for Suspect/Counterfeit Electrical, Electronic, and Electromechanical (EEE) Parts. It will cover the General Requirements document, the Test Evaluation method, and the ten test methods that were all published in 2016.

Following a brief introduction to the electronics supply chain and an overview of the types of counterfeit parts, the first half of the course will focus on the General Requirements document combined with the selection and evaluation of test sequences for counterfeit part detection. An emphasis will be placed on practical implementation of the requirements, illustrated with examples wherever possible. This portion will address:

  • Overview of AS6171 document scope, structure and hierarchy
  • Key concepts and definitions
  • Risk assessment
  • Risk-based test sequence selection, including defects associated with various types of counterfeit parts and the confidence of detecting them using the various test methods
  • Sampling plans
  • Analysis and interpretation of results
  • Training and certification
  • The second half of the course will cover the ten individual test methods and their requirements. For each test method, a primer will be given on its purpose in the context of counterfeit EEE part detection, the associated procedure and equipment, and any special requirements concerning sample preparation or handling, reporting and personnel training. Wherever possible, specific examples and data will be presented of applications to detection of counterfeit parts. The list of covered test methods consists of:

  • External Visual Inspection (EVI) (including remarking, resurfacing, weight, dimensions, SEM)
  • X-Ray Fluorescence (XRF) (including lead finish, thickness)
  • Delid/Decapsulation Physical Analysis (DDPA)
  • Radiological Inspection (RI): X-ray imaging
  • Acoustic Microscopy (AM): external and internal
  • Electrical Test: Curve Trace, Full DC, Key Electrical Parameters for AC, Switching, and Functional Tests; ambient or over temperature (including environmental, burn-in, seal)
  • Raman Spectroscopy: materials identification
  • Fourier Transform Infrared Spectroscopy (FTIR): materials identification
  • Thermogravimetric Analysis (TGA): material analysis
  • Design Recovery (DR): device layout and function
  • To close out the course, a brief overview will be given of new test methods currently under development by the G-19A committee that are intended for release at a future date.




    WS2: Utilizing IPC-1782 - Component Traceability - To Reduce Risk Associated With Ingress Of Counterfeit Components

    Michael Ford Cameron Shearon Cameron Shearon, Raytheon & Michael Ford, Aegis Software
    Half-Day (Morning)

    Course Description
    Traceability is a defense against counterfeiters. When you build in verifiable traceability, you protect your product from being copied. IPC has developed a suite of standards for the electronics industry on traceability.

    This course explains how to implement an exact traceability program, based on IPC-1782, to lower the risk and cost of consequences associated with the ingress of counterfeit components. Utilizing automated IIoT data collection with the IPC Connected Factory Exchange (CFX) standard leads to cost-effective, comprehensive data collection. We explain how traceability can be applied, including changes to working practices. We also show how traceability leads to increased quality, productivity, and product reliability.

    Topics Covered:

  • Risk Identification - the need of traceability
  • The benefits of traceability
  • Introduction to IPC-1782
  • Traceability data collection
  • Traceability data storage
  • Operational guidelines for traceability data collection
  • Meeting regulatory and marketplace requirements
  • Traceability as part of the secure supply chain
  • Open discussion
  • This course is for supply-chain managers, designers, component engineers, brand protection specialists, and others.




    WS3: Electronic Part Obsolescence Forecasting, Mitigation, and Management

    Peter Sanborn Peter Sanborn, Director - Maryland Technology Enterprise Institute (Mtech)
    Half-Day (Afternoon)

    Course Description
    This course reviews DMSMS management best practices, the various mitigation approaches, and available methods of forecasting the obsolescence of parts. In addition, pro-active methods for managing obsolescence are discussed, including design refresh planning. The course is divided into 5 sections that cover:
    1. Introduction to Electronic Part Obsolescence
    2. Electronic Part Obsolescence Forecasting
    3. Electronic Part Obsolescence Mitigation
    4. Obsolescence Management Planning
    5. Strategic Obsolescence Management

    The course includes a review of commercial databases and associated decision support tool offerings.

    Course Outline:
    1. Electronic Part Obsolescence Introduction
        • Definitions
        • Understanding the problem
        • Management introduction
    2. Electronic Part Obsolescence Forecasting
        • Ordinal scale approaches
        • Data mining approaches
        • Commercial tools
        • Researching parts
    3. Electronic Part Obsolescence Mitigation
        • Overview of mitigation approaches
        • Lifetime/bridge buy – buy size determination
    4. DMSMS Management Planning
        • Management plan content and processes
        • Measuring system health
    5. Strategic Obsolescence Management
        • Design refresh planning
        • Constraints management
    6. Closing and Discussion








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