Symposium on Counterfeit Parts and Materials

Technical Symposium and Expo: June 27-29, 2017
Workshops: June 29, 2017

College Park Marriott Hotel & Conference Center
College Park, MD

2017 Tech Sessions

Tuesday, June 27

7:30 AM
Registration and Breakfast
8:15 AM
Opening Remarks
Session 1: Opening Session
8:30 AM
Keynote talk 1: "Cloned" Devices - How Similar or Different Are Those from Originals
9:15 AM
SAE and its Role in Developing Suite of Counterfeit Electronics and Materiel Avoidance Standards
Judith Ritchie, SAE International
9:45 AM
Break – Visit with exhibitors
Session 2: Standards
10:15 AM
Risk assessment in SAE 6171
11:00 AM
JESD-243, Who is it Intended to Serve.
Lee Mathiesen, Lansdale Semiconductor Inc
11:30 AM
Meeting the ‘Risk Assessment’ requirements of ISO 9001:2015, AS9100D or AS9120B
Anne Poncheri
12.00 PM
1:00 pm
Session 3: Panel Discussion on Role of Test Laboratories in Reporting
2:15 PM
Break – Visit with exhibitors
Session 4: Future Technologies
2:45 PM
Supply Chain Hardware Integrity for Electronics Defense (SHIELD) using Small “Dielets”
Parrish Ralston, Northrop Grumman ES
3:15 PM
Barricade: Authentication Testing of Integrated Circuits through Power Consumption Waveform Analysis
Tom Bergman, Battelle
3:45 PM
Advanced Detection of Electronic Counterfeits (ADEC) for Enhanced Supply Chain Assurance Against Sophisticated Counterfeits
Andrew Portune, Nokomis, Inc.
4:15 PM
Counterfeit Detection Using Power Spectrum Analysis
Guillermo Loubriel, Ph.D., Sandia National Laboratories
4:45 PM
Day Closure

Wednesday, June 28

7:30 AM
Registration and Breakfast
Session 5: Counterfeits Lifecycle
8:15 AM
Keynote Address 2: An Overview of Historical Trends Relating to Suspect Counterfeit, Non-Conforming and High Risk Electronic Components
9:00 AM
The Semiconductor Lifestyle Solution
Dan Deisz, Rochester Electronics
9:30 AM
Existing Obsolescence Prediction Models Are Now Obsolete
Bill Fliegel, Converge
10:00 AM
Break – Visit with Exhibitors
Session 6: Detection Related Issues
10:30 AM
11:00 AM
Inspection tool and techniques for detecting counterfeit parts
Peter Panaguiton,GIDEP
11:30 AM
Negative Impacts and Detection Method of Counterfeit Electronic Parts
Huiwei Wu,China CEPREI Laboratory
12:00 PM
Session 7: Current and Future Tool
1:00 PM
Deployed Forensic Cloud-Based Track & Trace Platform
Janice Meraglia, Applied DNA Sciences
1:30 PM
AG Interrogator to Validate Electronic Parts
George LaFever, Corelis, Inc.
2:00 PM
Fraudulent Parts Reduction via RFID-Enabled Drone Inventory Management and Supply Chain Optimization
Latasha Taylor Starr, University of Texas at Arlington.
2:30 PM
Break – Visit with exhibitors
Session 8: Views Across Supply Chain
3:00 PM
3:30 PM
What is an Authorized Aftermarket Manufacturer
Lee Mathiesen, Lansdale Semiconductor Inc.
4:00 PM
Panel Discussion: Lessons from the Industry
5:00 PM
Closing Observations


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Thursday, June 29 (Martin Hall, University of Maryland)

8:00 AM
8:30 AM –
5:00 PM
Implementation Process of SAE 6171
Michael Azarian, Ph.D., CALCE
8:30 AM –
5:00 PM
Use of Component Documentation and Supply Chain for Counterfeit Avoidance
Diganta Das, Ph.D., CALCE

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