Tutorials
| Half day (3.5 hours) educational courses are led by internationally respected professionals with extensive experience in the subject area. Course instructors deliver focused, in-depth presentations on topics of current importance to the industry, based on their research and industry experience. |
Tutorials are application oriented and structured to combine field experience with scientific research to solve everyday problems. Tutorials are offered on Sunday, Monday, and Thursday to provide you the opportunity to attend the conference sessions and visit the exhibit floor.
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SUNDAY, October 13
ADVANCED PACKAGING - Sunday
T1
Advanced Component Packages & Processes
S. Manian Ramkumar, Ph.D., Rochester Institute of Technology
Sunday, October 13 | 8:30am – 12:00pm | Room 104A-B
Course Objectives
This workshop will identify and categorize the advanced components packages, their nomenclature and construction, and packaging trends. Discussions will relate to miniature and embedded passive technologies, their assembly process, and IC packaging technologies. Participants will be provided an understanding of substrates, substrate requirements, and means for thermal management with advanced packages. Benefits and issues of various advanced IC packages including the assembly process requirements will be introduced. Specific packages to be discussed include Quad Flat Pack No Lead (QFN), Area Array Packages (BGAs, CSPs, Wafer Level CSPs, Package-on-Package, CGAs and Flip Chips), and Multi Chip Modules (MCM). A brief discussion of equipment requirements for advanced component assembly will also be included.
Topics Covered
1.) Introduction
2.) Electronics Packaging & Levels
What is electronics packaging?
Levels of Electronics Packaging
Thermal Management
Substrate Properties
3.) Active SMT Components
Active Component Types
Active Component Configurations
Active Component Specifications
IC Packaging Trends
Package Evolution
Factors Influencing the Package Evolution
4.) Ball Grid Array (BGA) Packages
Why are BGAs so popular?
Manufacture of BGAs
BGA Configurations
5.) Plastic BGAs
Component Construction & Details
Plastic BGA Benefits & Issues
Self-Centering of PBGAs
6.) Ceramic BGA (CBGA)
Component Construction & Details
Ceramic BGA Benefits & Issues
7.) Tape BGA (TBGA)
Component Construction & Details
Tape BGA Benefits & Issues
8.) Super BGA
Component Construction & Details
9.) Chip Scale Packaging (CSP)
CSP Types
CSP Packages
CSP Packaging for Automated Assembly
Factors Influencing Increased Interest in CSP Packages
10.) Wafer Level Packaging & I/O Redistribution
11.) Package-on-Package (PoP) Assembly
12.) Flip Chip Attach
What is flip chip?
Flip Chip Attach-Size Advantage
Flip Chip Bumping
Flip Chip Packaging for Assembly
Flip Chip Assembly Process
What is Encapsulation?
Flip Chip Attach-Benefits
Flip Chip Attach-Issues
13.) Ceramic Column Grid Array (CCGA)
Component Construction & Details
CCGA Solder Joint-Thermal-Fatigue-Induced Failure
14.) Multi-Chip-Module (MCM)
MCM Constructions
Benefits & Issues
15.) System-In-Package (SIP)
16.) MEMS Packaging
T4
Flip Chip Technology and Processing – What, Why & How
Daniel F. Baldwin, Ph.D., Engent, Inc.
Sunday, October 13 | 8:30am — 12:00pm | Room 103B
Course Objectives
Flip chip assembly technology is gaining increased acceptance in the electronics industry. Annual growth rates projected through the next decade are 30% or higher. While flip chip technology was developed over forty years ago by IBM, it has only recently began to gain market share in the semiconductor packaging and surface mount module industries.
This course will present flip chip process technology focusing on the technology and process fundamentals of What, Why and How. The course includes extensive handouts covering flip chip structures, commercial driving forces, and fundamental flip chip process technology and materials. Flip chip processing of solder interconnect system is the main focus. Alternate flip chip interconnect processes including conductive adhesive interconnect systems and thermosonic interconnects will be covered at a high level. In addition, the basics of key technology elements such as underfill processing, reliability, and failure analysis will be presented.
Topics Covered
What:
Breakdown of the Structure
Development and Commercial Examples
Why:
Driving Forces
Advantages and Disadvantages
Commercial Market Breakdown
How:
Conventional SMT
C4 (Controlled Collapse Chip Connection)
DCA (Direct Chip Attach)
Isotropic Conductive Adhesive Attach (ICP)
Anisotropic Conductive Adhesive Attach (ACP)
Non-Conductive Adhesive Technology Attach (NCP)
Thermosonic Bonding
Production Flow
T8
3D Packaging, Interconnect, and Assembly
Charles Bauer, Ph.D., TechLead Corporation
Sunday, October 13 | 1:30pm — 5:00pm | Room 103B
Course Objectives
After more than a decade the industry continues to recognize the power of the third dimension in package, sub-system and system assembly for the implementation of highly integrated electronic products. 3D assembly and packaging of both active and passive devices opens a new world of performance and integration to system designers. Numerous approaches reported and demonstrated include those based on package stacking (package-on-package, origami, and edge stacked modules) and those based on die stacking (wire bond, mixed technology, edge redistribution, interposers, and through-silicon-via or TSV).
TSV and interposer technologies stand out from the others as 3D device integration approaches as opposed to 3D packaging methods. Consequently, through silicon via technology and interposers present unique opportunities and challenges. For example, TSVs promise unrivaled performance improvements due to short, low impedance interconnect and high silicon efficiency. On the other hand, no other 3D approach disrupts the existing supply chain so dramatically.
Updated annually to include the latest developments, this course covers both fundamental and advanced technologies that today produce stacked chip packages and assemblies as well as stackable packages for implementation of highly integrated electronic products. These include the challenges of die thinning, thin die handling and attachment, multi-level wire bonding, mixed technology die attachment and bonding, flip chip, TAB and TSV technologies. Substrate selection for various 3D packaging techniques including silicon tiles, flex circuit origami and specialty interposers concludes the chip stacking section of the course. Several examples of specific 3D package structures demonstrate both the power and limitations of these approaches.
Package on Package (PoP) SMT assembly processes include flux dip and paste dip, the challenges of fine pitch printing, placement and reflow of PoP packages and warpage control in multi-level packages inspection and rework of multilevel package assemblies. The instructors also identify common defects occurring in PoP and 3D package assembly such as head-on-pillow, no-wet opens, chip flex, etc. as well as their prevention and repair.
Further considerations for 3D electronics include stackable packages based on flex and rigid substrate approaches, integrated system-in-package techniques and multilayer, embedded passive technologies. Additional coverage of SMT design and assembly implications rounds out the technical content of the course. Using multiple examples of 3D packages in actual usage today, the course also presents a review of the drivers, economics, and intellectual property landscape behind 3D packaging.
Topics Covered
3D History, Trends & Drivers Packaging
Conventional Die Stacking
Assembly process guidelines for BTC
Through Silicon Vias
Integrated Passives Interconnection
Major design considerations for BTCs
Substrates
Interposers Enabling Technologies Package on Package (PoP)
SMT Stacked Packages
Printing
Placement
Dip
Reflow
PoP Underfill
PoP Rework failure analysis techniques
PoP inspection
Common PoP defects 3D Applications Economics of 3D (Confusing, ask Chuck about this one?)
Integration
Chip Stacking/TSV versus PoP Intellectual Property Landscape for 3D Packaging
SUBSTRATES - Sunday
T2
Electrochemical Migration and Conductive Anodic Filament (CAF) Formation
Laura Turbini, Ph.D., International Reliability Consultant
Sunday, October 13 | 8:30am — 12:00pm | Room 202C
Course Objectives
Electrochemical migration (ECM) is the movement of an ionic species under the influence of a DC voltage. This course will present the factors which affect ECM and the failure modes that it can produce. Test methods that will be discussed include surface insulation resistance (SIR), electrochemical migration (ECM) and a quantitative copper corrosion test, developed by Dr. David Bono and modified by the presenter. A special case of ECM is CAF formation. This failure mode will be discussed in detail and the chemistry of the filament will be explained. The effect of processing chemicals, board design, etc. will also be included.
Topics Covered
Electrochemical migration (ECM) and the factors which accelerate it
Failure modes associated including surface dendrites, subsurface conductive anodic filament formation and open circuit failure
Relevant test methods including surface insulation resistance (SIR), ECM, and a new copper corrosion test
Conductive Anodic Filament (CAF) formation
a.Historic Perspective
b.Impact of processing temperature, substrate, materials and processing chemicals
c.Effect of today’s high density boards d.Chemistry of CAF formation
T3
Design and Assembly Process Principles for Flexible and Rigid Flex Circuits
Vern Solberg, Invensas Corporation
Sunday, October 13 | 8:30am — 12:00pm | Room 103A
Course Objectives
The design guidelines for flexible circuits, although similar to rigid circuits, are somewhat unique. In essence, flex-circuits furnish unlimited freedom of packaging geometry while retaining the precision density, and repeatability of printed circuits. Flex-circuits typically replace the common hard-wire interface between electronic assemblies. The flexible circuits, however, have significant advantages over the hard-wired alternative because they fit only one way, eliminate wire routing errors, and save up to 75% on space and weight. Because the flex-circuit conductor patterns can maintain uniform electrical characteristics they contribute to controlling noise, crosstalk, and impedance. The flex-circuits will often be designed to replace complex wire harness assemblies and connectors to further improve product reliability.
During the workshop program participants will have an opportunity to review and discuss base material sets, alternative fabrication methodologies and SMT-on-flex assembly processes. The workshop will also include practical supplier recommendations for ensuring quality, reliability and manufacturing efficiency.
Topics Covered
1. Applications and use environment
Commercial/Consumer
Industrial/Automotive
Medical/Aerospace
2. Material and component selection
IPC standards for flex and rigid-flex dielectrics
Base material and metallization technologies
Selection criteria for SMT components
SMT land pattern development
3. Design guidelines for flexible and rigid-flex circuits
Flex circuit outline planning
Circuit routing and interconnect methodologies
Fold and bend requirements
SMT land pattern reinforcement criteria
4. Assembly processing of flex and rigid-flex circuits
Dimensioning and tolerance criteria
Palletized layout for in-line assembly processing
SMT assembly process variations and methodologies
Alternative joining methods for flexible circuits
MANUFACTURING AND ASSEMBLY - Sunday
T5
SMT Process Fundamentals for Tin-Lead and Lead Free Assembly
S. Manian Ramkumar, Rochester Institute of Technology
Sunday, October 13 | 1:30pm — 5:00pm | Room 104A-B
Course Objectives
This course will provide an introductory but holistic understanding of the surface mount and mixed technology assembly processes for lead based and lead free electronics packaging. Topics include PCBs, assembly types, component types, assembly process, assembly materials, identification of defects, troubleshooting and process control. Design for ease of manufacture and assembly will be discussed throughout the lecture. Tradeoff decisions between different materials and equipment types will also be highlighted. A comparison of lead based and lead free process will be provided, including implementation issues.
Topics Covered
1.) Electronics Packaging & Levels
Functions of Packaging
Thermal Management Issues
PCB Packaging
Assembly Types
Assembly Process Sequence
2.) PCB Types, Materials and Manufacturing
3.) Overview of Through Hole Technology
Component Types & Process Steps
4.) Overview of Surface Mount Technology
Passive Component Types
Active Component Specifications
Active Component Types (ICs)
Common SMT assembly process
5.) Stencil Printing
Solder Paste-Characterization, Types, Handling & Safety
No-Lead Solder and its Impact
Stencils and Squeegees-Materials, Types & Manufacturing
Print Parameters
Process requirements for Lead Free
Print Characteristics, Defects and Corrective Action
6.) Adhesive Dispense
Adhesive Types, Selection & Dispensing Techniques
Inspection
Reflow Curing
7.) Component Placement
Factors Influencing the use of Automated Placement Equipment
Machine Configurations & Types
Component Packaging for Automated placement
8.) Soldering
Reflow Soldering
Typical Reflow Profile
Profiling & its importance-How to?
Factors affecting good reflow
Lead Free Solder and Profiling Changes
Wave Soldering
Changes needed for Lead Free Solder
Process Sequence & Defects
9.) Cleaning Materials, Process, & Testing for cleanliness
10.) Inspection Techniques, Assembly Defect Identification and Corrective Action
11.) Testing of PCB Assemblies
12.) Rework and Repair
T6
Ball Grid Array: Principles and Practice
Ray Prasad, Ray Prasad Consultancy Group
Sunday, October 13 | 1:30pm — 5:00pm | Room 202C
Course Objectives
Ball Grid Array (BGA) is one of many surface mount components but it brings unique challenges in both design and assembly of the mixed assembly products. There is great interest in BGA because it offers so many benefits such as real estate savings, high yield and better electrical performance. Despite these promises, there are many problems in BGA and CSP (Chip Scale Packaging). The need to implement lead free simply compounds the problem due to intentional or unintentional mix of tin lead and lead free components on a mixed assembly board.
This course is based on Ray's book Surface Mount Technology: Principles and Practice, Second Edition, and IPC standard the latest version (April 2008) of IPC-7095 (Design and Assembly of BGA) currently chaired by Ray.
This is not a theoretical course. It is based on Ray’s years of experience in successfully implementing SMT at Boeing and Intel, and various clients. This course deals with "real-world" problems in SMT and BGA. For example, why moisture and warpage are more of a concern BGA than in any other type of SMT components, how are DFM guidelines different for BGA than for other SMT components and how are they affected by ball size, pitch and I/O count, how to improve paste transfer when you have both higher pitch SMT components with a lower pitch CSP/BGA on the same board.
How do you really inspect and repair BGA and what to do about backward and forward compatibility issues when you have no choice but to deal with tin-lead and lead free BGA on the same board. And what are some of the major defects such as ball drop, smiling and frowning BGA and black pad in BGA and how to deal with them. And you will learn everything you wanted to know about voids but were afraid to ask about various types of voids in BGA, their impact and their minimization and acceptance criteria to meet industry standard. And is BGA the end of the road? What is after BGA? You will also get an insight into the interdependency of design and manufacturing to achieve higher yield, lower cost and faster time to market.
Topics Covered
BGA Component Styles: Tin-lead, No Lead and High Lead
Industry Standard for BGA Design and Assembly (IPC-7095)
Driving Forces for BGA
Major Concerns with BGA: Moisture and Warpage
BGA Design Rules and Guidelines – Impact of ball size, pitch and I/O count
BGA Assembly Processes: Issues and Answers
Printing and Reflow Profiling Guidelines
Backward & Forward Compatibility Issues and role of selective laser reflow
Impact of Lead Free on BGA Reliability
Various Types of Voids in BGA, their impact, measurement and control
Major Concerns in BGA Defects
BGA Repair
What is After BGA?
CSP/PoP/Flip Chip
Summary
T7
The “Deadly Sins” of SMT and Lead-Free Assembly
Phil Zarrow and Jim Hall, ITM Consulting
Sunday, October 13 | 1:30pm — 5:00pm | Room 103A
Course Objectives
Everyone has heard of the “7 Deadly Sins” that will, supposedly, lead one to Hell. There are also the “Deadly Sins” of SMT - there are more than just 7 – and they can make your assembly process a “hell on earth”.
During the course of our assembly process audits and troubleshooting work, we tend to see trends in the types of errors and problems. In other words, a lot of people are making the same mistakes. The resulting process problems wreak havoc with an impact on assembly yields ranging from 5 to 20%. In addition to this direct cost, there is also additional financial impact with regard to time spent reworking and repairing, the on corrective action by QC, Engineering and Management, and, of course, “do-over”.
This workshop identifies the “deadly sins” of SMT assembly, both for Pb-free and “leaded” processes. Besides the symptoms and consequences of each type of error, root-cause, rectification and prevention techniques will be presented. Best Practices will be discussed for each of the key process steps. The workshop will, thus, provide the participant with an understanding of how to identify and correct the most common SMT assembly problems. It will include identification of vendor and source problems including components and materials as well as design related problems.
Topics Covered
Areas of General Process "Sins"
Utilization of Process Feedback Data
Design for Manufacturability and Assembly
In-Process Inspection and AOI
Solder Paste Selection
MSD
Procedures and Documentation
MONDAY, October 14
MANUFACTURING AND ASSEMBLY - Monday
T9
SMT Manufacturing: Preventing Production Defects and Failures – Part 1
Jennie Hwang, Ph.D., H-Technologies Group
Monday, October 14 | 8:30am — 12:00pm | Room 202C
Course Objectives
Considering the new and anticipated developments in packaging and assembly, to set the goal to achieve high yield production and to produce reliable products, this course addresses the prevalent issues occurring on the production floor, which likely decrease the yield, increase the cost and jeopardize reliability. The course focuses on “how-to” prevent the issues and take remedial measures through the understanding of potential causes. Specific defects associated with BTCs and PoPs will also be outlined. The morning session (Part 1) will discuss the deficiencies and defects related to solder joints and soldering, and the issues related to components and PCB bare board will be discussed in the afternoon session (Part 2). Attendees are encouraged to bring their concerns for discussion.
Topics Covered
Solder joint void (is solder joint void an issue, what are various sources, how to minimize voids and what are acceptance criteria?)
Solder joint surface crack (is it a reliability issue? what are causes and can it be avoided?
Solderability (how to achieve optimal wetting and what are the differences between Pb-free and SnPb in wetting?)
Solder balling and beading (what are causes and how to minimize them?)
Cold solder joint (what are key factors of cold solder joints?)
Starved solder joint (what are root causes of starved solder joint and mitigation measures?)
Open solder joint (What are root causes of open joint and mitigation measures?)
Head-on-pillow defect (what are potential causes, factors, remedies?)
Copper dissolution (what are factors and remedies? What is the impact on thru-hole solder joint reliability?)
Through-hole barrel filling (what are process parameters to achieve optimal filling?)
Wave and selective soldering issues (what are likely issues and solutions related to wave soldering and selective-wave-soldering? and solutions?)
Black pad (what are causes and remedies of Black pad?)
Pb-contamination (what is considered to be the threshold?)
Defects of BTC solder joints (prevention and remedies)
Defects of PoP solder joints (prevention and remedies)
T11
Design and Assembly Process Challenges for Bottom Terminations Components (BTCs) such as QFN, DFN and MLF in Tin-Lead & Lead Free World
Ray Prasad, Ray Prasad Consultancy Group
Monday, October 14 | 8:30am — 12:00pm | Room 104A-B
Course Objectives
Bottom Termination surface mount Components (BTCs) go by various names such as QFN, DFN, SON, LGA, MLP, and MLF, which utilize surface to surface interconnections. BTCs are like BGAs but without the balls. This minor difference in the physical I/O shape makes all the difference in design, assembly and rework between BTCs and BGAs.
Since there are no leads or balls in BTCs to take up any slack from package or board warpage, you essentially need perfection in design and assembly process. When was the last time you saw everything perfect on any manufacturing floor?
One must also keep in mind that these parts are not the only components that must be mounted on the board. Look at any board. It will have other packages such as BGAs, fine pitch and even some through-hole components; and those components have their own unique design and assembly implementation requirements. So designing for BTCs may involve trial and error and lot of frustration by many companies. Additional frustration is caused by fast-paced changes in packaging technologies and the advent of Lead Free has compounded the designer’s task.
When it comes to inspection, BTCs pose even more challenge than BGAs. What you may see in visual inspection may look bad but may really be acceptable. And what you don’t or can’t see may really be critical. And the fact that the Process Engineer must worry about both too much solder and too little solder on the same BTC package makes the quality engineer nervous about field returns.
The objective of the course is to get away from the trial and error approach and provide you successful design and process practices commonly used by the industry. This course will cover the practical details of BTC design and assembly processes.
This course is based on Surface Mount Technology: Principles by Ray Prasad and Practice and IPC 7093 Design and Assembly Process Guidelines for BTCs also co-chaired Ray. This course identifies many of the characteristics that influence the successful implementation of robust and reliable BTC assembly processes.
This is not a theoretical course. It Is based on Mr. Prasad's over two decades of experience at Boeing, Intel and numerous clients and deals with "real-world" problems in lead free and tin-lead BTC implementation.
Topics Covered
Introduction
Pros and Cons of BTC
Pull Back Vs Non Pull Back
BTC Package Manufacturing Process
Major Design Considerations for BTCs
Laminates and Surface Finish Considerations
Land Pattern and Stencil Design Guidelines
Component considerations
Assembly Process Guidelines for BTC
Solder Paste Printing- the Key Process Step
Reflow Process Guidelines
BTC Solder Joint Quality Requirements
BTC Rework Process
Key strategies in design and manufacturing processes to prevent field returns
T13
Key Issues of High-Speed Digital Design
Robert Hanson, Americom Seminars, Inc.
Monday, October 14 | 1:30pm — 5:00pm | Room 103A
Course Objectives
The objective of this course is to provide the attendee with the knowledge to do it right the first time. The course provides tools for recognizing the problems with any proposed high-speed design. Design rules and design processes are taught that insure the PCB will function properly at the prototype stage. The course emphasizes cost competitive design without sacrificing high-speed integrity.
Topics Covered
Digital signal edge rate, frequency, and harmonic content
Ground Bounce
What causes is and how to minimize it
Transmission Lines (TL) and lumped circuits
Characteristic impedance (Zo), microstrips, striplines, EM fields, and land-trace geometries
TL Characteristics and Analysis
Near and far end reflections
Input acceptance function
Output transmission function
Signal degradation due to the capacitive load
Crosstalk
Far and near crosstalk
Causes and methods for minimizing crosstalk for both microstrips and stripline
Terminations
How to design source and end terminations to minimize reflections
Bypassing
Achieving the proper impedance between the power and ground rails using IC die, innerplane, and discrete capacitances
Power Delivery
Providing the required current at the required time to the required IC pins
Connectors
Why they cause radiated emissions, crosstalk, TL, reflections, and distortion
Source Synchronous Clocking
Interfacing to high-speed chip sets, DDR, and RD RAM
T15
Design for Manufacturing (DFM): Impacts to Achieving High Yield Process with Today's PCB and Component Packaging
Dale Lee, Plexus Corp.
Monday, October 14 | 1:30pm — 5:00pm | Room 104A-B
Course Objectives
Today’s PCB and assembly design tolerances, materials and component packaging technologies have impacted traditional assembly processes with very tight solder application, component placement and soldering constraints. Using traditional assembly and soldering process controls are insufficient to achieve a high yielding manufacturing process. This course will introduce the element of matching the assembly/soldering process to the requirements in the product design. Examples of several opportunities within this process for yield improvement through manufacturing tooling design, SMT and PTH assembly process matching and environmental controls that can impact manufacturing yields will be presented.
Topics Covered
Global Product Design Elements
PCB Design Impacts
Wave Solder Design Impacts
SMT Solder Design Impacts
Thermal Balance, Trace Routing, Equipment Limitation/Tolerance, PCB/PCB Array Tolerance, Process Tooling Design
Process Control Impacts
Paste Volume, Thermal Shock SMT & PTH, Reflow Process Warpage
Cleaning Impacts
Assembly and Test Compatibility Issues: Low Stand-off Components, PCB Construction, Test Point Density, Next Higher Assembly
T14
SMT Manufacturing: Preventing Production Defects and Failures – Part 2
Jennie Hwang, Ph.D., H-Technologies Group
Monday, October 14 | 1:30pm — 5:00pm | Room 202C
Course Objectives
Considering the new and anticipated developments in packaging and assembly, to set the goal to achieve high yield production and to produce reliable products, this course addresses the prevalent issues occurring on the production floor, which likely decrease the yield, increase the cost and jeopardize reliability. The course focuses on “how-to” prevent the issues and take remedial measures through the understanding of potential causes. Specific defects associated with BTCs and PoPs will also be outlined. The morning session (Part 1) will discuss the deficiencies and defects related to solder joints and soldering, and the issues related to components and PCB bare board will be discussed in the afternoon session (Part 2). Attendees are encouraged to bring their concerns for discussion.
Topics Covered
Tin whisker (what are the causes of tin whiskers and what are the practical solutions? What are the differences between tin whisker and tin pest?)
BGA solder ball drop (what are the implications of BGA solder ball drop under SAC solder paste reflow?)
BGA crack (how to control and mitigate BGA plastic package crack during reflow?)
BGA/CSP interposer heat damage (what is the primary cause?)
BGA/CSP co-planarity issue (what are remedies?)
BGA rework challenge (how to achieve successful rework for high-pin-count large BGAs?)
Ceramic chip capacitor damage (what are causes and preventive measures?)
SOT component cracks (what are mitigating measures?)
Tome-stoning (what are causes and remedies?)
01001 component issue (what is the best practice?)
PCB board sagging (how to prevent it during reflow?)
PCB-related issues to watch (discoloration; de-lamination; blistering; PCB warp; Z-axis thermal expansion; intrinsic interconnect open; electro-migration; Cu-pad peel strength reduction; thru-hole barrel crack)
PCB Cu-pad lifting
PCB Pad cratering
Overall thermal damage (prevention)
T17
Implementing High Reliability Lead-Free Assembly and Test Methodology - NEW!
Matt Kelly, IBM Corporation
Monday, October 14 | 1:30pm — 5:00pm | Room 201C
Course Objectives
This course will discuss essentials for successfully implementing High Reliability Lead-Free Assembly and Test Methodologies for use with high complexity, mission critical electronics. Technical elements and course content will be presented using Lead-Free Technology Case Studies.
Topics Covered
Driving Forces and Strategic Approach
Advanced Lead-Free Technology Element Case Studies
Materials
Components and Temperature Limits
System Level Testing and Hardware Qualifications
Lead-Free Design for Manufacturability Considerations
Implementing High Complexity, High Reliability Lead-Free Assembly: A Recipe for Success
Successes, Remaining Challenges and Best Practices Summaries
QUALITY AND RELIABILITY - Monday
T12
Failure Analysis: Lessons Learned in Manufacturing and Research
Martin Anselm, Ph.D., Universal Instruments Corporation
Monday, October 14 | 8:30am — 12:00pm | Room 103B
Course Objectives
Universal Instruments Corporation’s Advanced Process Laboratory has observed countless failures in electronics manufacturing. From fine pitch printing, to PoP and high Tg laminate failures. These failures combined with internal research have provided a unique perspective for design for manufacturability and reliability. These lessons will be presented to the class when we discuss material selection, current electronics research, and failure analysis case studies. We will touch on design considerations for many advanced assembly processes as well as discussing types of analytical techniques that can be used for materials characterization.
Topics Covered
What the major difficulties in lead-free reliability testing are
Mixed alloy assembly best practices
PCB plating considerations
Analytical testing techniques and what they can identify root causes for production failures
Lead-free laminate selection and testing procedures: Can your board withstand 9x reflow?
Learned lessons from actual failure analysis case studies
FA Tools and Techniques to be discussed include the following:
Thermogravimetric Analysis & IR
Ion Chromatography
Ion Contamination
Shadow Moire
SEM/EDS
Wetting Balance/Solderability
Acoustic Microscopy
White Light Interferometry
Mechanical Testing
Optical Microscopy
Mechanical Strain Gauge Analysis & Strain limits
X-Ray Inspection
Environmental Testing
Solder Paste Print Transfer Efficiency
Micro Hardness Testing
Dye Penetration Testing
Micro Sectioning
Cross-section Etching
Suggestion: Bring specific questions or examples of surface mount process difficulties you are willing to share for an open discussion at end of class. In my experience many problems can be solved with a brief discussion of the issues.
SOLDERING - Monday
T10
Selective Soldering Processing and Manufacturability
Bob Klenke, ITM Consulting
Monday, October 14 | 8:30pam — 12:00pm | Room 103A
Course Objectives
This workshop teaches the essentials of selective soldering and describes process variables serving as guidance to enhance the flexibility, reliability and quality provided by the selective soldering equipment. Selective soldering with lead-free alloys will be discussed in detail including differences in process parameters compared to tin-lead solder such as solderability aspects, wetting behavior of lead-free alloys, and higher operating temperatures. Numerous case studies based on the instructor's experience will be presented. The workshop is based on real-world consulting practice defining the proper understanding of component limitations, clearance restrictions, thermal requirements and solder joint reliability issues that will insure complete knowledge of the selective soldering process.
Topics Covered
1.) Fundamentals of Through-Hole Soldering
Capillary action and through-hole vertical fill
Solder joint formation and vertical force model
Component thermal mass differential and process parameters
Thermal processing and intermetallic layer formation
2.) Solderability
Oxidation layers and surface wetting
Zero force wetting time and bare board cleanliness
Post-soldering iconic contamination levels and dross abatement
Manual soldering and component re-tinning
3.) Solder Alloys
Tin-lead and lead-free alloys and surface wetting characteristics
Alloy characteristics and copper dissolution
Melting point and HMP alloys
Solder nozzle and solder pot temperature correlation
4.) Flux Deposition and Flux Activation
Liquid flux chemistries and thermal aspects of flux activation
Preheat temperature and typical thermal profile
Time-temperature limitations
No-clean thermal processing and mitigation of flux residues
5.) Thermal Profiling
Thermal transfer characteristics
Thermocouple location selection criteria
Instrumentation techniques and preheating methodologies
Preheat selection and sustained preheat
6.) Through-Hole Design Guidelines
Lead-to-hole aspect ratio and lead projection
Lead pitch and DFMA guidelines
Adjacent component clearance and critical keep-out areas
Interlayer construction, ground planes and thermal relief design rules
7.) Quality Measurement
Solder joint inspection criteria
Post-soldering inspection protocols and inspection methodologies
Pareto analysis of defect type
Defect frequency and location
8.) Troubleshooting Guideline
Defect condition and root cause analysis
TH solder defect cause and effect matrix
Defect resolution
Prevention of re-occurrence
9.) Process Optimization
Optimization of process parameters
DPMO and OFD quality measurement
DoE methodologies and validation run
Defect mapping techniques
10.) Preventative Maintenance
Maintenance procedures, practices and frequency
Solder nozzle maintenance
Solder alloys contamination levels
T16
Soldering Technology for SMT: Achieving High Yields and Reliability
Timothy Jensen, Indium Corporation
Monday, October 14 | 1:30pm — 5:00pm | Room 103B
Course Objectives
In this workshop, a detailed discussion of soldering materials, components, and PCBs will be given to help the attendee understand the important aspects of each to produce a complete electronics product that meets current and future legislative restrictions. Additionally, a detailed discussion of the assembly process will be covered with an examination of process optimization and defect elimination.
Topics Covered
The Different Solder Alloy Systems (Cost and Reliability), How the Pb-Free Alloys Were Chosen, Trends Toward Alternative Alloys, The Importance of Dopants
How Solder Paste Selection Influences Profitability, Reliability, and Efficiency, Composition: Flux, Powder and the Many Additives, Powder Types, The Formation of Intermetallics, Sn/Pb vs. Pb-Free
Optimizing the Pb-Free Stencil Printing Process, Why 65% of Assembly Defects are From Printing, SMT Printing Fundamentals, Stencil Design, Achieving an Optimized Lead-Free SMT Printing Process
The Pb-Free Reflow Process , Lead-Free Reflow Differences, Ramp to Peak versus Soak Profiles, Achieving an Optimized Lead-Free SMT Reflow Process, Pb-Free SMT Defects: Causes and Solutions, Tombstoning, Graping, Head-In-Pillow, Voiding, Poor Wetting, Higher Temperature Issues
Through-hole Soldering Alternatives, Lead-Free Wave Soldering Process Fundamentals, Reliability vs. Hole Fill: J-STD-004B Dilemma, SAC vs SnCu Alloys, SMT Alternatives to Wave Soldering
THURSDAY, October 17
SUBSTRATES - Thursday
FREE half day course for SMTA MEMBERS! You are required to register to receive a handout and a Certificate of Completion, but there is no charge for the course. (Non-member rate applies.)
T17
Design for Reliability for PCBs
Cheryl Tulkoff, DfR Solutions
Thursday, October 17 | 8:30am — 12:00pm | Room 104A-B
Course Objectives
Designing printed boards today is more difficult than ever before because of the increased lead free process temperature requirements and associated changes required in manufacturing. Not only has the density of the electronic assembly increased, but many changes are taking place throughout the entire supply chain regarding the use of hazardous materials and the requirements for recycling. Much of the change is due to the European Union (EU) Directives regarding these issues. The RoHS and REACH directives have caused many suppliers to the industry to rethink their materials and processes. Thus, everyone designing or producing electronics has been or will be affected.
Topics Covered
Introduction
Intro to Design for Reliability
DfR and Physics of Failure (PoF)
Printed Circuit Boards
Laminated Selection
Plated Through Vias (PTVs)
Cracking and Delamination
PTH Barrell Cracking
CAF
Strain/Flexure Issues & Pad Cratering
Cleanliness
Electrochemical Migration
Surface Finishes
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 I've consistently left the conference with valuable knowledge from relevant and substantive papers that could be directly applied to my active projects.
Randy Schueller
DfR Solutions
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