Thursday, November 21
One full-day and one half-day workshop will be held on Thursday, led by industry professionals with extensive experience in their respective subject areas. Workshop instructors deliver focused, in-depth presentations on topics of timely importance, based on their research and industry experience.
Counterfeit Part Avoidance and Detection
8:30am – 5:00pm
Diganta Das and Bhanu Sood, CALCE
Counterfeit electronics components continue to make news. In recent years, the
prevalence of these fake parts has only increased, with reports of parts
discovered in military systems, medical devices and process control equipment.
The elements of the methods that broadly define the methods of protecting your
· Supply chain management (proper procurement policies)
· Assessment of parts, manufacturers, and distributors
· Life cycle management including obsolescence
· Supply chain level authentication
· Counterfeit risk detection (through
· Traceability verification using tools such as serialization
· Law enforcement and government policies
Who Should Attend:
Engineers and managers tasked with developing counterfeit prevention policies
for a company will find this course valuable. This course prepares them to not
only create a policy for the company but also allows them to assess if the
policies of their supply chain partners are strong and can contribute to the
problems of counterfeit parts. The quality managers and test engineers tasked
with detection of counterfeit parts will learn about in depth techniques that
go far beyond the visual inspection methods and prepare the company in
detecting well-made counterfeit parts. Workshop attendees will also learn how
to effectively engage testing laboratories in a cost effective manner to
determine risk of counterfeit components.
About the Instructors:
Diganta Das (Ph.D., Mechanical Engineering, University of Maryland, College Park, B.Tech, Manufacturing Science and Engineering, Indian Institute of Technology) is a member of the research staff at the Center for Advanced Life Cycle Engineering. His expertise is in reliability, environmental and operational ratings of electronic parts, uprating, electronic part reprocessing, counterfeit electronics, technology trends in the electronic parts and parts selection and management methodologies. He performs benchmarking processes and organizations of electronics companies for parts selection and management and reliability practices. Dr. Das has published more than 50 articles on these subjects, and presented his research at international conferences and workshops. He had been the technical editor for two IEEE standards and is vice chairman of IEEE Reliability Society Standard Board coordinating two additional standards. He is an editorial board member for the journal Microelectronics Reliability and Circuit World. He is a Six Sigma Black Belt and a member of IEEE and IMAPS.
Bhanu Sood is the Director of the Test Services and Failure Analysis Laboratory at CALCE. Bhanu's research areas at CALCE include development of analysis methodologies for component- and PCBA-level failures, materials characterization techniques for counterfeit parts identification, and investigating failure mechanisms in printed circuit boards. Prior to joining CALCE, Bhanu worked at the Naval Research Laboratory in the areas of embedded electronics, embedded batteries, and laser-assisted micro-fabrication techniques. Bhanu holds a US Patent for a laser-based technique for the transfer and embedding of electronic components and devices.