Symposium on Counterfeit Parts and Materials

Technical Symposium and Expo: June 28-30, 2016
Workshops: June 30, 2016

Marriott Inn & Conference Center
College Park, MD

Workshops

Thursday, June 30

Three workshops will be held on Thursday, led by industry professionals with extensive experience in their respective subject areas. Workshop instructors deliver focused, in-depth presentations on topics of timely importance, based on their research and industry experience.

Please note: the workshops will be located in Glen L. Martin Hall on the University of Maryland Campus.

WS1: Implementation Process of SAE 6171

Michael Azarian, CALCE

WS2: Counterfeit Detection Inspection Techniques

Jason Jowers, Velocity

WS3: Use of Component Documentation and Supply Chain for Counterfeit Avoidance

Diganta Das, CALCE




WS1: Implementation Process of SAE 6171

Michael Azarian, CALCE
Full-Day 8:30am-5:00pm

Overview
Counterfeit parts have found their way into every sector of industry, from consumer electronics and appliances to safety-critical areas including avionics, medical devices, and military systems. Pressure to meet production targets and parts shortages have led companies to obtain parts from outside the authorized distribution chain, leading to opportunities for counterfeiters to capitalize on the demand for parts that may be in short supply. Nevertheless, counterfeits have found their way into parts of the supply chain that would not normally be doubted. The variety and volume of counterfeit parts in circulation has been growing as counterfeiters devise increasingly sophisticated and devious methods of covering their tracks.

In the absence of uniform standards to govern test methods for counterfeit part detection and avoidance, organizations and test laboratories have developed widely varying approaches to mitigating the risk. This has led to inconsistencies and gaps in the processes, technologies, and quantitative risk assessment methodologies needed to address the problem.

SAE established the G-19A Test Laboratory Standards Development Committee to develop a risk-based testing standard for counterfeit detection and avoidance. Over the past five years, subject matter experts and interested parties from industry, government, academia, and test laboratories have come together to draft a set of twelve documents that set out requirements and recommendations for risk assessment, test procedures and selection, sampling criteria, training, workmanship, and reporting associated with detection of counterfeit electrical, electronic, and electromechanical parts. Most of these documents have completed committee balloting and are awaiting final approval by SAE for publication, making their availability imminent. Their impact will be difficult to underestimate, as they will fill a huge void in industry’s arsenal for combating a pernicious threat.

This full-day course will provide a thorough introduction to the requirements and hierarchy of the AS6171 Test Methods Standard for Suspect/Counterfeit Electrical, Electronic, and Electromechanical (EEE) Parts. It will cover the General Requirements document, the Test Evaluation method, and the ten test methods that are all in draft form as of this writing.

Outline
Following a brief introduction to the electronics supply chain and an overview of the types of counterfeit parts, the first half of the course will focus on the General Requirements document combined with the selection and evaluation of test sequences for counterfeit part detection. An emphasis will be placed on practical implementation of the requirements, illustrated with examples wherever possible. This portion will address:

  • Overview of AS6171 document scope, structure and hierarchy
  • Key concepts and definitions
  • Risk assessment
  • Test sequence selection including defects associated with various types of counterfeit parts and the confidence of detecting them using the various test methods
  • Sampling plans
  • Analysis and interpretation of results
  • Training and certification
  • The second half of the course will cover the ten individual test methods and their requirements. For each test method, a primer will be given on its purpose in the context of counterfeit EEE part detection, the associated procedure and equipment, and any special requirements concerning sample preparation or handling, reporting and personnel training. Wherever possible, specific examples and data will be presented of applications to detection of counterfeit parts. The list of covered test methods consists of:

  • External Visual Inspection (EVI) (including remarking, resurfacing, weight, dimensions, SEM)
  • X-Ray Fluorescence (XRF) (including lead finish, thickness)
  • Delid/Decapsulation Physical Analysis (DDPA)
  • Radiological Inspection (RI): X-ray imaging
  • Acoustic Microscopy (AM): external and internal
  • Electrical Test: Curve Trace, Full DC, Key Electrical Parameters for AC, Switching, and Functional Tests; ambient or over temperature (including environmental, burn-in, seal)
  • Raman Spectroscopy: materials identification
  • Fourier Transform Infrared Spectroscopy (FTIR): materials identification
  • Thermogravimetric Analysis (TGA): material analysis
  • Design Recovery (DR): device layout and function
  • To close out the course, a brief overview will be given of new test methods currently under development by the G-19A committee that are intended for release at a future date.




    WS2: Counterfeit Detection Inspection Techniques

    Jason Jowers, Velocity
    Half-Day 8:30am-12:30pm

    Overview
    This course will (1) give the attendees an understanding of useful techniques to use to identify suspect counterfeit electronic components (e.g. microscopy, X-ray, decapsulation, remarking test, resurfacing tests) and (2) provide the attendees with the opportunity to apply that knowledge by personally inspecting suspect counterfeit components with microscopes.

    Outline
    Presentation

  • Description of the prevalence of counterfeit components, the threat those pose to the industry, and counterfeiting techniques
  • Description and photos of the different types of nonconforming conditions that are most commonly present in components
  • Description and photos of different types of false positives (conditions which may cause Inspectors to erroneously fail good product)
  • Description of the different types of inspection techniques that are used to identify suspect

  • Hands-on Application
  • Use marking permanency test, acetone wipe test, scrape test, and microscopy inspection to inspect components

  • Who Should Participate

  • Managers who need to become familiarized with this topic
  • Engineers who need to learn inspection techniques




    WS3: Non-Compliant or Suspect Counterfeit Products & Packaging Materials

    Bob Vermillion, CPP/Fellow CEO, Director of Innovation. RMV Technology Group, LLC at NASA-Ames
    Half-Day 1:30pm-5:00pm

    Overview
    There is NO alternative to good supply chain management as a defense against counterfeit parts. Many types of products that have to be manufactured and supported for long periods of time lack control over critical parts of their supply chain, e.g., avionics and space, telecom infrastructure, and industrial controls. Much of the problem regarding counterfeit electronics is due to lack of due diligence by the part buyers. Understanding of the supply chain and assessing the supply chain before engaging them are necessary steps for any organization. This part of the course will cover how to understand and utilize process change notices for making supply change management and counterfeit detection more efficient. The role of counterfeit part reporting as a legal and technical tool along with its promises and limitations will be discussed with examples. Impact of the US DoD rule changes on the supply chain will be introduced.

    Outline

  • Electronic Part Supply Chain
         Participant
         Evolution
  • Assessment of Electronic Part Manufacturers and Parts
  • Assessment of Electronic Part Distributors
         Methods and Case Study
         Standards
  • How to Assess and Utilize Process Change Notices
         Introduction and examples
         Use in counterfeit detection
  • Status of Counterfeit Electronics Related Standards
         Standards Related to Part Distributor Assessment – SAE 6081 and SAE 6496
         JEDEC Standard (JESD243) on “Counterfeit” Parts
         Updates to SAE 5553 and Related ARP, Definitions
         IPC 1782 – Traceability Standard
  • Counterfeit Part Reporting
         Forums for Reporting
         Pros and Cons
  • How to Assess and Utilize Process Change Notices
         Introduction and Examples
         Use in Counterfeit Detection
  • Impact of DFAR Changes in Counterfeit Avoidance
         Features of DFAR
         Impacts of DFAR
  • Closure and Discussion

    Who Should Participate

  • Supply chain managers
  • Design engineers
  • Logistics managers
  • Legal professionals
  • Policy makers on counterfeit prevention Engineers in electronic part selection and management groups





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