Counterfeit Electronic Parts and
Electronic Supply Chain Symposium

June 24-26, 2014
College Park Marriott Hotel and Conference Center
College Park, MD
Organized by SMTA and CALCE
The Conference
   Tech Sessions
   Tech Committee    Advisory Board


Event Sponsor:

Media Sponsor:
Circuits Assembly

Endorsed by:
SAE International

Tech Sessions

(More information at CALCE website)

June 24-25, 2014

Speakers for the event will include:

SigNature DNA Marking: An Update on the Authentication Platform DLA Has Selected As Part of Their Counterfeit Prevention Effort for Electronics

Janice Meraglia, Applied DNA Sciences

Clones - The Final Frontier of the Component Counterfeiter..?

Thomas Sharpe, SMT Corporation

SAE Counterfeit Mitigation Standards for the Electronics Industry

Anne Poncheri, Anne Poncheri Quality Consulting

Market Dynamics and Technical Limits of Cloning, Obsolescence, and Counterfeit

Dan Deisz, Rochester Electronics

Optimizing Your Authentication Solution

SharonFlank, InfraTrac

Decapsulation Capabilities and Sample Inspection

Eric Jordan , Nisene

Counterfeit Materials and Products in the Construction Supply Chain

Edward Minchin, University of Florida

The Dodd-Frank Act and Its Implications for the Electronics Supply Chain

Randy Daugharthy, Bureau Veritas

Advanced Physical Inspection Methods for Counterfeit Detection

Sina Shahbazmohamadi, University of Connecticut (CHASE)

Usage of Process Dependent Random Inaccuracies As Tracking Marks

Matthias Steiert, University of Freiburg

Failure Threat Caused by Counterfeit Parts and Effort Made by the Chinese

Youliang Wang, China CEPREI Lab

Material Database for Counterfeit Detection Support

Diganta Das, UMD

Design Refresh As A Solution Peter Sandborn, UMD

X-ray Techniques

Bill Cardoso, Creative Electron


(View details)

June 26, 2014

WS1: Electronic Part Supply Chain Evaluation and Managing Electronic Part Obsolescence

Diganta Das, Ph.D., CALCE and Peter Sandborn, CALCE

WS2: Latest Tools and Techniques for Counterfeit Parts Identification and Mitigation

Bhanu Sood, CALCE/Univ. of Maryland
Anne Poncheri, Quality Consulting
Sultan Ali Lilani, Integra Technologies

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