Symposium on Counterfeit Parts and Materials

Technical Symposium and Expo: June 23-24, 2015
Workshops: June 25, 2015

Marriott Inn & Conference Center
College Park, MD

Tech Sessions

June 23-24, 2015


Tuesday, June 23

7:30 AM Registration and Breakfast Speaker
8:10 AM Opening Remarks Diganta Das, Ph.D., CALCE - UMD
Session 1: Opening Sessions
8:15 AM Keynote: Functional Clones – The Most Dangerous NEW Counterfeit Threat Facing D&A Industry Manufacturing Today Tom Sharpe, SMT Corporation
8:45 AM Role of National IPR Center in Combating Counterfeit Amy Turner, ICE | Homeland Security Investigations | IPRC
9:15 AM Counterfeit: A System Integrator Perspective Andre Oliveira, EMBRAER S.A.
9:45 AM Trends in Counterfeit Parts and the Supply Chain Fred Schipp, US Navy
10:15 AM Break  
Session 2: Standards
10:45 AM AS6081 - Its Creation, Evolution, and Current Utilization by a Certified Distributor Robb Hammond, AERI
11:15 AM AS6496 & the Authorized Distribution Channel Kevin Sink, TTI, Inc
11:45 AM AS6171 and Test Methods Mike Azarian, CALCE – UMD
12:30 PM Lunch  
Session 3: Materiels
1:30 PM Introduction to IDEA-QMS-9090 Lia Powell, IDEA
2:00 PM Successful Joint Force Collaborative Effort to Correct Unacceptably Deficient Material Received for Installation Onboard Naval Assets Karen Bruer, Amee Bay, LLC
2:30 PM Refrigerants Paula George, DLA
3:00 PM Break  
Session 4:  New Technologies
3:30 PM Algorithms: The New Frontier in Counterfeit Detection Bill Cardoso, Creative Electron
4:00 PM Surface Authentication System for Counterfeit Mitigation Harshad Sardesai, Chromologic, LLC
4:30 PM Anti-Counterfeiting for 3D Printing Sharon Flank, InfraTrac
5:00 PM Closure  

Wednesday, June 24

7:30 AM Registration and Breakfast  
Session 5: Testing
9:00 AM Most Open-Market Supplied Parts Come With Grossly-Insufficient Electrical Testing Tom Sharpe, SMTCorp
9:30 AM Innovating Solutions to Solving Integrated Circuit Obsolescence Issues Marty Lanning, XTREME Semiconductor
10:00 AM Cost Effective Electrical Testing for Risk Mitigation of Sophisticated Counterfeit ICs Sultan Liliani, Integra Technologies  
10:30 AM Break – Visit with Exhibitors  
Session 6: Technology Solutions
11:00 AM A Comprehensive Pragmatic Approach to Asset Authentication, Traceability and Security Peter Engel, SICPA Product Security
11:30 AM Supply Chain Assurance Using ADEC Technology Andrew Portune, Nokomis
12:00 PM Logical Vanishability for Counterfeit Prevention Hassan Salmani, Howard University
12:30 PM Lunch  
Session 7: Detection Programs
1:30 PM The Value and Complexities of Information Sharing Mark Snider, ERAI
2:00 PM Developing and Implementing a Counterfeit Mitigation Control Plan Anne Poncheri, AP Quality Consulting LLC
2:30 PM Part Defects Related to Counterfeit – A Historical Review Diganta Das, CALCE - UMD
3:00 PM Break  
3:30 PM Evaluation Of Product Authentication Technologies: A Detailed Evaluation Of The Current And Emerging Technologies Yaw Obeng, NIST
4:00 PM Panel on Tagging and Authentication – Pros and Cons Janice Meraglia, Applied DNA; Brent McLaws, DataDot and Others
5:00 PM Wrap – up  


(View details)

June 25, 2015

WS1: Electronic Part Supply Chain Evaluation and Managing Electronic Part Obsolescence for Counterfeit Avoidance

Diganta Das, Ph.D., CALCE and Peter Sandborn, Ph.D., CALCE - UMD

WS2: In Depth Training on Upcoming SAE AS6171 Counterfeit Part Detection Test Methods

Bhanu Sood, CALCE – UMD

WS3: Non-Compliant or Suspect Counterfeit Products & Packaging Materials

Bob Vermillion, RMV Technology Group, LLC at NASA-Ames

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